7卷第6期
Lightweight PCB Defect Detection Method Based on GSConv-CBAM and Knowledge Distillation for YOLOv11
Lightweight PCB Defect Detection Method Based on GSConv-CBAM and Knowledge Distillation for YOLOv11
- 2026年7卷第6期 页码：92-95
DOI：10.47297/taposatWSP2633-456919.20260706
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Wen Dai BeeLab, School of Future Science and Engineering Soochow University
Hao Lv BeeLab, School of Future Science and Engineering Soochow University
Cong Yang BeeLab, School of Future Science and Engineering Soochow University
Rui Xu BeeLab, School of Future Science and Engineering Soochow University
Yang Cao BeeLab, School of Future Science and Engineering Soochow University
Benbo Cao Nanjing University of Information Science & Technology
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BeeLab, School of Future Science and Engineering Soochow University
Nanjing University of Information Science & Technology
