Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8

Hanlin Huang

doi:10.47297/taposatWSP2633-456914.20250610

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Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8

Volume 6, Issue 10

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Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8
Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8
School of Advanced Manufacturing and School of Marine Sciences, Fuzhou University, Quanzhou, Fujian, 362200, China
Vol. 6, Issue 10, Pages: 72-80(2025)
Published：30 October 2025
DOI：10.47297/taposatWSP2633-456914.20250610
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Huang Hanlin.Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8[J].Theory and Practice of Science and Technology,2025,06(10):72-80.
DOI：

Huang Hanlin.Optimization of Mobile Screen Defect Detection Algorithm Based on Lightweight YOLOv8[J].Theory and Practice of Science and Technology,2025,06(10):72-80. DOI： 10.47297/taposatWSP2633-456914.20250610.

摘要

Abstract

With the rapid advancement of smart manufacturing and the consumer electronics industry

the surface quality of smartphone screens has become a critical indicator for evaluating product reliability and user experience. Traditional manual inspection methods struggle to meet the demands for efficiency and consistency in modern production. Consequently

automated visual inspection based on deep learning has emerged as a key development direction for industrial quality control. Addressing the limitations of existing YOLOv8 models in detecting small objects and high computational complexity

this paper proposes an improved algorithm

YOLOv8s-M4SE

which integrates a lightweight backbone network with a channel attention mechanism. Using a publicly available mobile screen defect dataset

we expand the sample distribution through multi-dimensional data augmentation strategies. In terms of network architecture

the original YOLOv8s backbone is replaced with MobileNetV4ConvSmall to reduce computational complexity

while introducing the SE channel attention module to enhance defect feature representation. Experimental results demonstrate that the YOLOv8s-M4SE model achieves an excellent balance between detection accuracy and computational efficiency. It provides a viable solution for applying deep learning in quality inspection for consumer electronics manufacturing.

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references

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